Equipment and Instrumentation
Optical Microscope
Brand: Olympus
The optical microscope is used for microstructural examination of materials through reflected light imaging. It enables detailed observation of grain structure, phase distribution, and surface features at various magnifications. The system is essential for routine metallographic analysis and provides a reliable foundation for material characterization studies.
Applications / Notes
Microstructural analysis of metallic materials
Grain size and phase distribution observation
Surface defect and inclusion analysis
Evaluation of polished and etched samples
Pre-analysis before advanced characterization techniques
Documentation of microstructural features
Scanning Electron Microscope (SEM)
Brand / Model: JEOL / JSM-6060
The scanning electron microscope (SEM) is used for high-resolution imaging of material surfaces by scanning them with a focused electron beam. The system provides detailed information on surface morphology, microstructure, and topographical features at micro- and nano-scale levels. It is an essential tool for advanced material characterization, enabling precise analysis beyond the capabilities of optical microscopy.
Applications / Notes
High-resolution surface imaging
Microstructural and morphological analysis
Fracture surface examination
Wear track and damage analysis
Particle size and shape characterization
Analysis of coatings and surface modifications
Microhardness Tester (Vickers Hardness System)
Brand / Model: Zwick/Roell / ZHV 10
The microhardness tester is used to determine the hardness of materials at micro-scale using the Vickers indentation method. A controlled load is applied through a diamond indenter, and the resulting indentation is measured to evaluate material hardness. The system is widely used for characterizing microstructural regions, phase-specific properties, and surface-treated materials.
Applications / Notes
Vickers microhardness measurement
Phase-specific hardness evaluation
Hardness mapping across microstructures
Analysis of coatings and surface-treated layers
Evaluation of heat-treated materials
Correlation of hardness with microstructural features
Optical Emission Spectrometer (OES)
The Optical Emission Spectrometer (OES) is used for rapid and precise determination of elemental composition in metallic materials. The system operates by exciting atoms in the sample surface using an electrical discharge, causing them to emit characteristic wavelengths of light. These emissions are analyzed to quantify the elemental composition with high accuracy. OES is widely used for alloy verification, quality control, and material identification.
Applications / Notes
Elemental composition analysis of metals and alloys
Alloy identification and verification
Quality control in material production
Detection of trace elements
Composition analysis of titanium and steel-based materials
Pre- and post-processing material validation